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Academics

Research Publications

Conference/ Seminar	URL	Title	Date	Location	File
VTS		Segmented Addressable Scan Architecture	05/05	Palm Springs, CA	vts2
ICCAD		Minimizing the Number of Test Configurations for FPGAs	11/04	San Jose, CA	iccad1
CRC		Ph.D. Dissertation: Testing, Diagnosing, and Screening FPGAs	06/04	Stanford, CA	thesis1
CRC		Subframe Multiplexing: Manufacturing Test Time Reduction	--	Stanford, CA	crc1
VTS		FPGA Bridging Fault Detection and Location via Differential IDDQ	04/04	Napa Valley, CA	vts1
ITC		FGPA Interconnect Delay Fault Testing	09/03	Charlotte, NC	itc1

Research Presentations

Conference/ Seminar	URL	Title	Date	Location	File 2up	File 6up
VTS		Segmented Addressable Scan Architecture	05/05	Palm Springs, CA	vts2	vts2
ICCAD		Minimizing the Number of Test Configurations for FPGAs	11/04	San Jose, CA	iccad1	iccad1
VTS		FPGA Bridging Fault Detection and Location via Differential IDDQ	04/04	Napa Valley, CA	vts1	vts1
Various Locations		The Test, Diagnosis, and Screening of FPGAs	04/04	Various Locations	job1	job1
RATS		Automated FPGA Fault Diagnosis (5-minute elevator talk)	03/04	Stanford, CA	rats8	rats8
RATS		Ph.D. Orals: Testing, Diagnosing, and Screening FPGAs	03/04	Stanford, CA	rats7	rats7
FPGA		Subframe Multiplexing: Test Configuration Time Reduction	02/04	Monterey, CA	fpga1	fpga1
RATS		Relative IDDQ Testing and Fault Location for FPGAs	12/03	Stanford, CA	rats6	rats6
ITC		FPGA Interconnect Delay Fault Testing	10/03	Charlotte, NC	itc1	itc1
RATS		Fast FPGA Interconnect Testing: A New Configuration Architecture	07/03	Stanford, CA	rats5	rats5
RATS		FPGA Interconnect Delay Fault Testing	04/03	Stanford, CA	rats4	rats4
BAST		FPGA Interconnect Delay Fault Testing	02/03	Santa Rosa, CA	bast1	bast1
RATS		Path Phase Difference Delay Fault Testing with Diagnosis	01/03	Stanford, CA	rats3	rats3
RATS		Methods for Detecting Resistive Opens in FPGA Interconnects	10/02	Stanford, CA	rats2	rats2
RATS		Exploiting FPGA's Configurability for Testing and Tolerance	06/02	Stanford, CA	rats1	rats1

Attended Educational Institutions

School	URL	Grades/Degree	Location
Stanford University		Doctor of Philosophy, Electrical Engineering	Stanford, CA
Stanford University		Master of Science, Electrical Engineering	Stanford, CA
San Jose State University		Exchange Student, Electrical Engineering	San Jose, CA
Michigan Technological University		Bachelor of Science, Electrical Engineering	Houghton, MI
H. H. Dow High School		10-12	Midland, MI
Jefferson Middle School		7-9	Midland, MI
Siebert Elementary School		K-6	Midland, MI

BAST: Pacific Northwest Test Conference CRC: Center for Reliable Computing FPGA: International Symposium on FPGAs ICCAD: International Conference on Computer Aided Design ITC: International Test Conference RATS: Reliability and Testability Seminar VTS: VLSI Test Symposium

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File last modified: Monday, 04-Apr-2005 10:37:11 PDT